AMS verification methodology regarding supply modulation in RF SoCs induced by digital standard cells

Speicher, Fabian; Meier, Jonas; Aghaie, Soheil; Wunderlich, Ralf; Heinen, Stefan

Piscataway, NJ / IEEE (2018) [Contribution to a book, Contribution to a conference proceedings]

Proceedings of the 2018 Design, Automation & Test in Europe (DATE) : 19-23 March 2018, Dresden, Germany / general chair: Jan Madsen, Technical University of Denmark, DK ; DATE 2018 sponsors: European Design and Automation Association, Electronic System Design (ESD) Alliance, IEEE Council on Electronic Design Automation, European Electronic Chips & Systems Design Initiative, ACM Special Interest Group on Design Automation, Russian Academy of Sciences
Page(s): 633-636

Identifier