RFIC Complexity a Challenge for Academia and Industry

Heinen, Stefan; Henkel, Frank

Piscataway, NJ / IEEE (2018) [Buchbeitrag, Beitrag zu einem Tagungsband]

[2018 IEEE International Conference on Integrated Circuits, Technologies and Applications, ICTA, 2018-11-21 - 2018-11-23, Beijing, Peoples R China]
Seite(n): 1-6

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