RFIC Complexity a Challenge for Academia and Industry
Heinen, Stefan; Henkel, Frank
Piscataway, NJ / IEEE (2018) [Buchbeitrag, Beitrag zu einem Tagungsband]
[2018 IEEE International Conference on Integrated Circuits, Technologies and Applications, ICTA, 2018-11-21 - 2018-11-23, Beijing, Peoples R China]
Seite(n): 1-6
Identifikationsnummern
- DOI: 10.1109/CICTA.2018.8705721
- REPORT NUMBER: RWTH-2019-05966