Modeling approaches for functional verification of RF-SoCs : limits and future requirements

Wang, Yifan (Author); Joeres, Stefan (Author); Wunderlich, Ralf (Author); Heinen, Stefan (Author)

New York, NY / IEEE (2009) [Journal Article]

IEEE transactions on computer-aided design of integrated circuits and systems : CAD
Volume: 28
Issue: 5
Page(s): 769-773