Hooge parameter of InGaAs bulk material and InGaAs 2DEG quantum well structures based on InP substrates

Berntgen, Jürgen; Behres, Alexander; Kluth, Jürgen; Heime, Klaus; Daumann, Walter; Auer, Uwe; Tegude, Franz-Josef

Oxford [u.a.] / Pergamon Press (2000) [Journal Article]

Microelectronics reliability
Volume: 40
Issue: 11
Page(s): 1911-1914