CMOS Hall-Sensor System for Absolute Linear Length Measurement

Wunderlich, Ralf; Schumacher, Klaus

Berlin [u.a.] / VDE-Verl. (2000) [Contribution to a book, Contribution to a conference proceedings]

MICRO.tec 2000 : applications - trends - visions ; proceedings / VDE World Microtechnologies Congress, September 25 - 27, 2000, Expo 2000, Hannover, Germany. Organized by VDE Association for Electrical, Electronic & Information Technologies. Sponsored by EUREL .... - Vol. 2
Page(s): 541-545

Identifier

  • REPORT NUMBER: RWTH-CONV-202505