Statistic Variations in Integrated CMOS Magnetic Field Sensor

Wunderlich, Ralf; Thomas, Carsten; Schumacher, Klaus

Utrecht / Technology Foundation, STW (2000) [Contribution to a conference proceedings]

Proceedings / SAFE - ProRISC - SeSens 2000, November 29 - December 1, Veldhoven, The Netherlands / STW.

Identifier

  • REPORT NUMBER: RWTH-CONV-203638