Low-frequency noise phenomena in InP-based HFETs related to stress induced degeneration and interface properties

Sommer, V.; Kohl, A.; Weigel, K.; Mesquida K├╝sters, A.; Heime, K.

Piscataway, NJ / IEEE Service Center (1995) [Contribution to a book, Contribution to a conference proceedings, Journal Article]

International Conference Indium Phosphide and Related Materials
Volume: 7
Page(s): 857-860

Identifier