An Automated Parameter Extraction Framework for Functional Verification of Mixed-Signal SoCs

Schleyer, Martin; Wang, Yifan; Heinen, Stefan

Berlin [u.a.] / VDE-Verl. (2012) [Contribution to a book, Contribution to a conference proceedings]

PRIME 2012 : 8th Conference on Ph.D. Research in Microelectronics & Electronics, 12 - 15 Juni 2012, Aachen, Germany / [General Chairs: Stefan Heinen ...]
Page(s): 4 S.

Identifier

  • REPORT NUMBER: RWTH-CONV-204723