Observation and modelling of RTS in InAlAs/InGaAs/InP HFETs

Sommer, V.; Hedrich, J.; Weigel, K.; Perillieux, O.; Heime, Klaus

Amsterdam / Elsevier (1995) [Journal Article]

Solid state electronics : SSE
Volume: 38
Issue: 11
Page(s): 1917-1922

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