The Impact of Noise and Mismatch on SAR ADCs and a Calibratable Capacitance Array Based Approach for High Resolutions

Müller, Jan Henning Benjamin; Strache, Sebastian; Busch, Laurens; Wunderlich, Ralf; Heinen, Stefan

s.l.] / Polska Akademia Nauk, Komitet Elektroniki i Telekomunikacji (2013) [Journal Article]

International journal of electronics and telecommunications : JET
Volume: 59
Issue: 2
Page(s): 161-167