Fully integrated 65nm lna with notch filter for saw-less fdd frontends
Bormann, Dirk; Werth, Tobias Daniel; Kählert, Stefan; Neyer, Andreas August; Heinen, Stefan
Utrecht / STW (2009) [Contribution to a book, Contribution to a conference proceedings]
Proceedings / SAFE 2009, ProRISC 2009 : 12th Annual Workshop on Semiconductor Advances for Future Electronics and Sensors ; 20th Annual Workshop on Circuits, Systems and Signal Processing ; November 26 - 27, 2009, Veldhoven, The Netherlands / organized by STW ...
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